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http://hdl.handle.net/10773/6210
Título: | Study of calcium implanted GaN |
Autor: | Alves, E. Liu, C. Lopes, E.B. Da Silva, M.F. Soares, J.C. Boemare, C. Soares, M.J. Monteiro, T. |
Palavras-chave: | GaN Lattice location RBS/channeling |
Data: | 2002 |
Editora: | Elsevier |
Resumo: | Single crystalline GaN samples were implanted with several fluences of Ca ions at room temperature (RT) and 550 °C. The implantation at high temperature reduces significantly the damage. The measured minimum yield along the 〈0 0 0 1〉 axis in the implanted region increases from 15% to 40% when the substrate temperature during the implantation was changed from 550 °C and RT. The lattice site location was analysed simultaneously by measuring channeling effect on the backscattering particles and the particle-induced X-ray emission. Despite the different damage level, the regular fraction of Ca atoms in GaN lattice in both implantation conditions was roughly the same directly after the implantation (fs ∼ 50%), as indicated by the angular scans. Annealing at 1050 °C for 15 min in flowing N2 results in a significant recovery of the damage, but no changes were found for the Ca profile. The angular scans along the 〈0 0 0 1〉 and 〈1 0 1̄ 1〉 axial directions indicate that Ca is occupying mainly interstitial sites |
Peer review: | yes |
URI: | http://hdl.handle.net/10773/6210 |
DOI: | 10.1016/S0168-583X(01)01187-9 |
ISSN: | 0168-583X |
Aparece nas coleções: | DFis - Artigos |
Ficheiros deste registo:
Ficheiro | Descrição | Tamanho | Formato | |
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NIMB.pdf | versão pdf do editor | 116.93 kB | Adobe PDF |
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