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http://hdl.handle.net/10773/35964
Título: | Exploring Charged Defects in Ferroelectrics by the Switching Spectroscopy Piezoresponse Force Microscopy |
Autor: | Alikin, Denis Abramov, Alexander Turygin, Anton Ievlev, Anton Pryakhina, Victoria Karpinsky, Dmitry Hu, Qingyuan Jin, Li Shur, Vladimir Tselev, Alexander Kholkin, Andrei |
Palavras-chave: | Bias field Domain walls Hysteresis loops Polarization reversal Vacancies Screening |
Data: | 15-Fev-2022 |
Editora: | Willey-VCH |
Resumo: | Monitoring the charged defect concentration at the nanoscale is of critical importance for both the fundamental science and applications of ferroelectrics. However, up-to-date, high-resolution study methods for the investigation of structural defects, such as transmission electron microscopy, X-ray tomography, etc., are expensive and demand complicated sample preparation. With an example of the lanthanum-doped bismuth ferrite ceramics, a novel method is proposed based on the switching spectroscopy piezoresponse force microscopy (SSPFM) that allows probing the electric potential from buried subsurface charged defects in the ferroelectric materials with a nanometer-scale spatial resolution. When compared with the composition-sensitive methods, such as neutron diffraction, X-ray photoelectron spectroscopy, and local time-of-flight secondary ion mass spectrometry, the SSPFM sensitivity to the variation of the electric potential from the charged defects is shown to be equivalent to less than 0.3 at% of the defect concentration. Additionally, the possibility to locally evaluate dynamics of the polarization screening caused by the charged defects is demonstrated, which is of significant interest for further understanding defect-mediated processes in ferroelectrics. |
Peer review: | yes |
URI: | http://hdl.handle.net/10773/35964 |
DOI: | 10.1002/smtd.202101289 |
ISSN: | 2366-9608 |
Versão do Editor: | https://onlinelibrary.wiley.com/doi/full/10.1002/smtd.202101289 |
Aparece nas coleções: | CICECO - Artigos |
Ficheiros deste registo:
Ficheiro | Descrição | Tamanho | Formato | |
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Paper_SSPFM_Submitted_with_Suppl.pdf | 1.91 MB | Adobe PDF | Ver/Abrir |
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