Utilize este identificador para referenciar este registo: http://hdl.handle.net/10773/20294
Título: Mesoscale Domains and Nature of the Relaxor State by Piezoresponse Force Microscopy
Autor: Shvartsman, V. V.
Dkhil, B.
Kholkin, A. L.
Palavras-chave: SCANNING PROBE MICROSCOPY
GRAINED BARIUM-TITANATE
TRUE CRITICAL EXPONENTS
FIELD ISING-MODEL
SINGLE-CRYSTALS
THIN-FILMS
ELECTROMECHANICAL RESPONSE
POLYCRYSTALLINE RELAXORS
PIEZOELECTRIC BEHAVIOR
DIELECTRIC-PROPERTIES
Data: 2013
Editora: ANNUAL REVIEWS
Resumo: Ferroelectric relaxors continue to be one of the most mysterious solid-state materials. Since their discovery by Smolenskii and coworkers, there have been many attempts to understand the properties of these materials, which are exotic, yet useful for applications. On the basis of the numerous experimental data, several theories have been established, but none of them can explain all the properties of relaxors. The recent advent of piezoresponse force microscopy (PFM) has allowed for polarization mapping on the surface of relaxors with subnanometer resolution. This development thus leads to the question of whether the polar nanoregions that contribute to diffuse X-ray scattering and a range of macroscopic properties can be visualized. This review summarizes recent advancements in the application of PFM to a number of ferroelectric relaxors and provides a tentative explanation of the peculiar polarization distributions related to the intriguing physical phenomena in these materials.
Peer review: yes
URI: http://hdl.handle.net/10773/20294
DOI: 10.1146/annurev-matsci-071312-121632
ISBN: 978-0-8243-1743-0
ISSN: 1531-7331
Versão do Editor: 10.1146/annurev-matsci-071312-121632
Aparece nas coleções: CICECO - Artigos



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