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http://hdl.handle.net/10773/20477
Title: | Effect of Composition on the Physical Properties at Nanoscale of PZT Thin Films |
Author: | Lima, E. C. Araujo, E. B. Bdikin, I. K. Kholkin, A. L. |
Keywords: | ZIRCONATE-TITANATE FILMS SELF-POLARIZATION ELECTRICAL-PROPERTIES THICKNESS DEPENDENCE FERROELECTRIC-FILMS PBZR1-XTIXO3 CAPACITORS |
Issue Date: | 2014 |
Publisher: | TAYLOR & FRANCIS LTD |
Abstract: | PbZr1-xTixO3 (PZT) thin films (x = 0.46, 0.47, 0.48, 0.49, and 0.50) were deposited on Pt/TiO2/SiO2/Si substrates using a polymeric chemical method to study the effects of the composition on the macroscopic electrical and local piezoelectric properties. Both measurements demonstrate the existence of a self-polarization effect in all studied PZT films. The measurements were discussed in terms of the contribution of the Schottky barriers to the self-polarization effect. It is shown that both Schottky barrier effect and mechanical coupling near the film-substrate interface are not the dominant mechanisms responsible for the observed phenomena. |
Peer review: | yes |
URI: | http://hdl.handle.net/10773/20477 |
DOI: | 10.1080/00150193.2014.894391 |
ISSN: | 0015-0193 |
Publisher Version: | 10.1080/00150193.2014.894391 |
Appears in Collections: | CICECO - Artigos |
Files in This Item:
File | Description | Size | Format | |
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Effect of Composition on the Physical Properties at Nanoscale of PZT Thin Films_10.108000150193.2014.894391.pdf | 645.5 kB | Adobe PDF |
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