Please use this identifier to cite or link to this item:
http://hdl.handle.net/10773/20477
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lima, E. C. | pt |
dc.contributor.author | Araujo, E. B. | pt |
dc.contributor.author | Bdikin, I. K. | pt |
dc.contributor.author | Kholkin, A. L. | pt |
dc.date.accessioned | 2017-12-07T19:48:26Z | - |
dc.date.issued | 2014 | pt |
dc.identifier.issn | 0015-0193 | pt |
dc.identifier.uri | http://hdl.handle.net/10773/20477 | - |
dc.description.abstract | PbZr1-xTixO3 (PZT) thin films (x = 0.46, 0.47, 0.48, 0.49, and 0.50) were deposited on Pt/TiO2/SiO2/Si substrates using a polymeric chemical method to study the effects of the composition on the macroscopic electrical and local piezoelectric properties. Both measurements demonstrate the existence of a self-polarization effect in all studied PZT films. The measurements were discussed in terms of the contribution of the Schottky barriers to the self-polarization effect. It is shown that both Schottky barrier effect and mechanical coupling near the film-substrate interface are not the dominant mechanisms responsible for the observed phenomena. | pt |
dc.language.iso | eng | pt |
dc.publisher | TAYLOR & FRANCIS LTD | pt |
dc.relation | info:eu-repo/grantAgreement/FCT/COMPETE/132936/PT | pt |
dc.rights | restrictedAccess | por |
dc.subject | ZIRCONATE-TITANATE FILMS | pt |
dc.subject | SELF-POLARIZATION | pt |
dc.subject | ELECTRICAL-PROPERTIES | pt |
dc.subject | THICKNESS DEPENDENCE | pt |
dc.subject | FERROELECTRIC-FILMS | pt |
dc.subject | PBZR1-XTIXO3 | pt |
dc.subject | CAPACITORS | pt |
dc.title | Effect of Composition on the Physical Properties at Nanoscale of PZT Thin Films | pt |
dc.type | article | pt |
dc.peerreviewed | yes | pt |
ua.distribution | international | pt |
degois.publication.firstPage | 106 | pt |
degois.publication.issue | 1 | pt |
degois.publication.lastPage | 114 | pt |
degois.publication.title | FERROELECTRICS | pt |
degois.publication.volume | 465 | pt |
dc.date.embargo | 10000-01-01 | - |
dc.relation.publisherversion | 10.1080/00150193.2014.894391 | pt |
dc.identifier.doi | 10.1080/00150193.2014.894391 | pt |
Appears in Collections: | CICECO - Artigos |
Files in This Item:
File | Description | Size | Format | |
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Effect of Composition on the Physical Properties at Nanoscale of PZT Thin Films_10.108000150193.2014.894391.pdf | 645.5 kB | Adobe PDF |
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