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http://hdl.handle.net/10773/11841
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DC Field | Value | Language |
---|---|---|
dc.contributor.author | Duarte, João Capela | pt |
dc.contributor.author | Martins, Ernesto Ventura | pt |
dc.contributor.author | Alves, Luis Nero | pt |
dc.date.accessioned | 2014-02-17T17:49:20Z | - |
dc.date.issued | 2013-12-15 | - |
dc.identifier.uri | http://hdl.handle.net/10773/11841 | - |
dc.description.abstract | Memristive Devices (MDs) are usually described by their associated hysteresis loops. Their distinctive memory properties stem from this unusual characteristic, which depends on both stimulus frequency and amplitude. Understanding the behavior of these devices is of paramount importance for a multitude of different applications. This paper investigates the dependency of loop area and length on stimulus amplitude of MDs. The characterization methodology follows the morphological approach, introduced by the authors in [10], for frequency characterization. An example, considering thin film TiO2 MDs reveals that the peak amplitude (amplitude where the loop has maximum area) of the device depends strongly on device dimensions and physical properties. | pt |
dc.language.iso | eng | pt |
dc.publisher | IEEE | pt |
dc.rights | restrictedAccess | por |
dc.subject | Memristive devices and systems | pt |
dc.subject | Hysteretic loops | pt |
dc.subject | Amplitude characterization | pt |
dc.title | Amplitude characterization of memristive devices | pt |
dc.type | conferenceObject | pt |
dc.peerreviewed | yes | pt |
ua.publicationstatus | published | pt |
ua.event.date | 8-11 december, 2013 | pt |
ua.event.type | conference | pt |
degois.publication.location | Abu Dhabi, EAU | pt |
degois.publication.title | IEEE International Conference on Electronics, Circuits, and Systems | pt |
dc.date.embargo | 10000-01-01 | - |
dc.relation.publisherversion | http://www.ieee-icecs2013.org/ | pt |
Appears in Collections: | DETI - Comunicações |
Files in This Item:
File | Description | Size | Format | |
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PID2978077.pdf | final paper | 256.21 kB | Adobe PDF |
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