Please use this identifier to cite or link to this item: http://hdl.handle.net/10773/7099
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dc.contributor.authorDomingues, Fátimapt
dc.contributor.authorRocha, Ana M.pt
dc.contributor.authorAndré, Paulo S.pt
dc.date.accessioned2012-02-29T16:23:24Z-
dc.date.issued2011-
dc.identifier.issn0895-2477pt
dc.identifier.urihttp://hdl.handle.net/10773/7099-
dc.description.abstractThe optical fibers are key components for the high-capacity telecommunications networks. The characteristics of physical contact optical connectors deteriorate when the fiber connector inlet face is contaminated or physically damaged, causing fatal failure or the performance degradation, In this work, we study the temperature and power-loss behavior for contaminated and physically damaged optical connectors, under high optical power regime. The results indicate that the connector lifetime when subjected to high propagation powers, depends essentially on its cleanness rather than the surface degradation resulting from the plugging/unplugging operations.pt
dc.language.isoengpt
dc.rightsrestrictedAccesspor
dc.subjectOptical fiber connectorpt
dc.subjectFiber fuse effectpt
dc.subjectHigh optical powerpt
dc.titleHigh-power effects in damaged and contaminated optical fiber connectorspt
dc.typearticlept
dc.peerreviewedyespt
ua.distributioninternationalpt
degois.publication.firstPage2485pt
degois.publication.issue11pt
degois.publication.lastPage2488pt
degois.publication.titleMicrowave and Optical Technology Letterspt
degois.publication.volume53pt
dc.date.embargo10000-01-01-
dc.identifier.doi10.1002/mop.26356*
Appears in Collections:DFis - Artigos

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