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http://hdl.handle.net/10773/26343
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DC Field | Value | Language |
---|---|---|
dc.contributor.author | Hortigüela Gallo, María J. | pt_PT |
dc.contributor.author | Otero Irurueta, Gonzalo | pt_PT |
dc.date.accessioned | 2019-07-31T16:25:56Z | - |
dc.date.available | 2019-07-31T16:25:56Z | - |
dc.date.issued | 2019-05 | - |
dc.identifier.uri | http://hdl.handle.net/10773/26343 | - |
dc.description.abstract | During the last years, an increasing number of students have visited the XPS laboratory for characterizing their samples with this experimental technique. Their background span over a wide range of fields such as physics, material science, chemistry and biology, among others. For most of them, both XPS and ultra-high vacuum technology were something new and they needed help to deal with the data of their samples. This book tries to concentrate the key information that a young researcher needs for a first approach to XPS. We hope the students will understand its working principle and will obtain the basic tools for analysing their data. | pt_PT |
dc.language.iso | eng | pt_PT |
dc.publisher | UA Editora | pt_PT |
dc.relation | UID/EMS/00481/2019 | pt_PT |
dc.relation | CENTRO-01-0145-FEDER-022083 | pt_PT |
dc.rights | openAccess | pt_PT |
dc.rights.uri | https://creativecommons.org/licenses/by/4.0/ | pt_PT |
dc.subject | Espectroscopia fotoeletrónica de raios X | pt_PT |
dc.subject | Química de superfícies | pt_PT |
dc.subject | Análise espectral | pt_PT |
dc.title | X-ray photoelectron spectroscopy: a surface characterization technique | pt_PT |
dc.type | book | pt_PT |
dc.description.version | published | pt_PT |
degois.publication.location | Aveiro | pt_PT |
dc.relation.publisherversion | https://cms.ua.pt/editora/ | pt_PT |
dc.identifier.esbn | 978-972-789-602-8 | pt_PT |
Appears in Collections: | DEM - Livro TEMA - Livro |
Files in This Item:
File | Description | Size | Format | |
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XPS - Book.pdf | 2.99 MB | Adobe PDF | View/Open |
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