Please use this identifier to cite or link to this item:
http://hdl.handle.net/10773/19348
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Okhay, O. | pt |
dc.contributor.author | Tkach, A. | pt |
dc.contributor.author | Wu, A. | pt |
dc.contributor.author | Vilarinho, P. M. | pt |
dc.date.accessioned | 2017-12-07T19:09:39Z | - |
dc.date.issued | 2013 | pt |
dc.identifier.issn | 0022-3727 | pt |
dc.identifier.uri | http://hdl.handle.net/10773/19348 | - |
dc.description.abstract | Structure, microstructure and low-temperature dielectric properties of undoped SrTiO3 (STO) thin films prepared by sol-gel and deposited on Si/SiO2/TiO2/Pt substrates are studied. The effect of annealing temperature and of buffer layers on properties of STO films is analysed. Dielectric permittivity epsilon', relative tunability n(r) and polarization P are lowest for STO films prepared without buffer layers and annealed at 750 degrees C and are highest for films prepared with buffer layers and annealed at 900 degrees C. The increase of c/a ratio for films with buffer layer and of the grain size for films annealed at higher temperature is used to explain the improved dielectric response. The dielectric permittivity of STO films prepared by low-cost sol-gel technique with optimized deposition conditions is found to be comparable to that of STO films fabricated by more sophisticated and expensive methods such as pulsed laser deposition. | pt |
dc.language.iso | eng | pt |
dc.publisher | IOP PUBLISHING LTD | pt |
dc.relation | info:eu-repo/grantAgreement/FCT/COMPETE/132936/PT | pt |
dc.rights | restrictedAccess | por |
dc.subject | TITANATE THIN-FILMS | pt |
dc.subject | 2-STEP GROWTH TECHNIQUE | pt |
dc.subject | STRONTIUM-TITANATE | pt |
dc.subject | SINGLE-CRYSTAL | pt |
dc.subject | STRAIN RELAXATION | pt |
dc.subject | INTERNAL-STRESSES | pt |
dc.subject | LOW-TEMPERATURE | pt |
dc.subject | ELECTRIC-FIELD | pt |
dc.subject | BUFFER LAYER | pt |
dc.subject | FERROELECTRICITY | pt |
dc.title | Manipulation of dielectric permittivity of sol-gel SrTiO3 films by deposition conditions | pt |
dc.type | article | pt |
dc.peerreviewed | yes | pt |
ua.distribution | international | pt |
degois.publication.issue | 50 | pt |
degois.publication.title | JOURNAL OF PHYSICS D-APPLIED PHYSICS | pt |
degois.publication.volume | 46 | pt |
dc.date.embargo | 10000-01-01 | - |
dc.relation.publisherversion | 10.1088/0022-3727/46/50/505315 | pt |
dc.identifier.doi | 10.1088/0022-3727/46/50/505315 | pt |
Appears in Collections: | CICECO - Artigos |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
Manipulation of dielectric permittivity of sol-gel SrTiO3 films by deposition conditions_10.10880022-37274650505315.pdf | 924.76 kB | Adobe PDF |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.