Please use this identifier to cite or link to this item: http://hdl.handle.net/10773/19169
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dc.contributor.authorTsui, H. C. L.pt
dc.contributor.authorGoff, L. E.pt
dc.contributor.authorBarradas, N. P.pt
dc.contributor.authorAlves, E.pt
dc.contributor.authorPereira, S.pt
dc.contributor.authorBeere, H. E.pt
dc.contributor.authorFarrer, I.pt
dc.contributor.authorNicoll, C. A.pt
dc.contributor.authorRitchie, D. A.pt
dc.contributor.authorMoram, M. A.pt
dc.date.accessioned2017-12-07T19:03:15Z-
dc.date.issued2015pt
dc.identifier.issn1862-6300pt
dc.identifier.urihttp://hdl.handle.net/10773/19169-
dc.description.abstractEpitaxial ScxGa1-xN films with 0 <= x <= 0.50 were grown using molecular beam epitaxy under metal-rich conditions. The ScxGa1-xN growth rate increased with increasing Sc flux despite the use of metal-rich growth conditions, which is attributed to the catalytic decomposition of N-2 induced by the presence of Sc. Microstructural analysis showed that phase-pure wurtzite ScxGa1-xN was achieved up to x = 0.26, which is significantly higher than that previously reported for nitrogen-rich conditions, indicating that the use of metal-rich conditions can help to stabilise wurtzite phase ScxGa1-xN. (C) 2015 WILEY-VCH Verlag GmbH \& Co. KGaA, Weinheimpt
dc.language.isoengpt
dc.publisherWILEY-V C H VERLAG GMBHpt
dc.relationinfo:eu-repo/grantAgreement/FCT/5876/147332/PTpt
dc.rightsrestrictedAccesspor
dc.subjectSCANDIUM NITRIDE FILMSpt
dc.subjectBAND-GAPpt
dc.subjectSTRUCTURAL-PROPERTIESpt
dc.subjectSPECTRApt
dc.subjectLAYERSpt
dc.titleThe effect of metal-rich growth conditions on the microstructure of ScxGa1-xN films grown using molecular beam epitaxypt
dc.typearticlept
dc.peerreviewedyespt
ua.distributioninternationalpt
degois.publication.firstPage2837pt
degois.publication.issue12pt
degois.publication.lastPage2842pt
degois.publication.titlePHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCEpt
degois.publication.volume212pt
dc.date.embargo10000-01-01-
dc.relation.publisherversion10.1002/pssa.201532292pt
dc.identifier.doi10.1002/pssa.201532292pt
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