Please use this identifier to cite or link to this item:
http://hdl.handle.net/10773/6636| Title: | Effect of the matrix on the 1.5 μm photoluminescence of Er-doped silicon quantum dots |
| Author: | Cerqueira, M.F. Stepikhova, M. Losurdo, M. Monteiro, T. Soares, M.J. Peres, M. Neves, A. Alves, E. |
| Keywords: | Ellipsometry Photoluminescence Silicon QD Structure |
| Issue Date: | 2006 |
| Publisher: | MSF |
| Abstract: | Erbium doped nanocrystalline silicon thin films were produced by reactive magnetron r.f sputtering. Their structural and chemical properties were studied by micro-Raman, spectroscopic ellipsometry and Rutherford backscattering spectroscopy. Films with different crystalline fraction and crystallite size were deposited by changing the deposition parameters. The impact of the composition and structure of Erbium ions environment on the 1.5 μm photoluminescence is discussed. |
| Peer review: | yes |
| URI: | http://hdl.handle.net/10773/6636 |
| DOI: | 10.4028/www.scientific.net/MSF.514-516.1116 |
| ISSN: | 0255-5476 |
| Appears in Collections: | DFis - Artigos |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| MSF.pdf | versão pdf do editor | 76.19 kB | Adobe PDF | View/Open |
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