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Title: Effect of the matrix on the 1.5 μm photoluminescence of Er-doped silicon quantum dots
Author: Cerqueira, M.F.
Stepikhova, M.
Losurdo, M.
Monteiro, T.
Soares, M.J.
Peres, M.
Neves, A.
Alves, E.
Keywords: Ellipsometry
Silicon QD
Issue Date: 2006
Publisher: MSF
Abstract: Erbium doped nanocrystalline silicon thin films were produced by reactive magnetron r.f sputtering. Their structural and chemical properties were studied by micro-Raman, spectroscopic ellipsometry and Rutherford backscattering spectroscopy. Films with different crystalline fraction and crystallite size were deposited by changing the deposition parameters. The impact of the composition and structure of Erbium ions environment on the 1.5 μm photoluminescence is discussed.
Peer review: yes
DOI: 10.4028/
ISSN: 0255-5476
Appears in Collections:DFis - Artigos

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