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http://hdl.handle.net/10773/6485| Title: | Distribution of 1.68 eV emission from diamond films |
| Author: | Correia, M.R. Monteiro, T. Pereira, E. Costa, L.C. |
| Keywords: | Diamond Elemental semiconductors Semiconductor thin films CVD coatings Photoluminescence Raman spectra Spectral line intensity Spectral line breadth |
| Issue Date: | 1998 |
| Publisher: | AIP |
| Abstract: | Free-standing polycrystalline chemical vapor deposition diamond films grown on a silicon wafer, with electrical behavior similar to values currently mentioned in the literature, present microheterogeneity. A detailed analysis by micro Raman shows how the diamond and nondiamond phases are distributed within the film and also the distribution of the silicon related luminescence. This luminescence is discussed in terms of two emitting centers close in energy. Absolute intensity of the diamond peak is not correlated with the good quality of the film as assessed by the Raman linewidth and ratio of this line to the nondiamond Raman lines |
| Peer review: | yes |
| URI: | http://hdl.handle.net/10773/6485 |
| DOI: | 10.1063/1.368284 |
| ISSN: | 0021-8979 |
| Appears in Collections: | DFis - Artigos |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| JAPL.pdf | versão pdf do editor | 102.22 kB | Adobe PDF | View/Open |
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