Please use this identifier to cite or link to this item:
Title: A test bed for wireless optical LANs
Author: Aguiar, R.L.
Tavares, A.
Alves, L. N.
Valadas, R.
Santos, D.M.
Keywords: Analogue electronics
Clock recovery circuits
Digital functions
LED drivers
Multiple technology
Physical layers
Real-life test
Sectored receiver
Viterbi decoder
Test facilities
Viterbi algorithm
Equipment testing
Issue Date: 2001
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Abstract: This paper presents a test bed for wireless optical LANS. This test bed is flexible, supporting multiple implementation choices. The test bed currently covers all physical layer issues, from FEC coders and LED drivers to front-ends, clock recovery circuits, Viterbi decoders, and sectored receivers. These are implemented with multiple technologies, with DSPs and FPGAs for digital functions, and ASICs and discrete electronics for the analogue electronics. Furthermore, the test bed provides a semi-controlled real life test environment, allowing for close comparison between theoretical and practical results. © 2001 IEEE.
Peer review: yes
DOI: 10.1109/ICECS.2001.957516
ISBN: 9780780370579
Appears in Collections:DETI - Comunicações

Files in This Item:
File Description SizeFormat 
Wless02.pdfDocumento final99.16 kBAdobe PDF    Request a copy

FacebookTwitterDeliciousLinkedInDiggGoogle BookmarksMySpace
Formato BibTex MendeleyEndnote Degois 

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.