Please use this identifier to cite or link to this item: http://hdl.handle.net/10773/5178
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dc.contributor.authorCabral, P. M.pt
dc.contributor.authorPedro, J. C.pt
dc.contributor.authorCarvalho, N. B.pt
dc.date.accessioned2012-01-17T12:40:45Z-
dc.date.issued2004-
dc.identifier.issn0018-9480pt
dc.identifier.urihttp://hdl.handle.net/10773/5178-
dc.description.abstractThis paper presents a nonlinear equivalent circuit model of microwave power GaN high electron-mobility transistors (HEMTs), amenable for integration into commercial harmonic balance or transient simulators. All the steps taken to extract its parameter set are explained, from the extrinsic linear elements up to the intrinsic nonlinear ones. The predictive model capabilities are illustrated with measured and simulated output power and intermodulation-distortion data of a GaN HEMT. The model is then fully validated in a real application environment by comparing experimental and simulated results of output power, power-added efficiency, and nonlinear distortion obtained from a power amplifier.pt
dc.description.sponsorshipFCT - POCTI/ESE/45050/2002: Model Extraction of FaN Transistors (MEGAN)pt
dc.description.sponsorshipEuropean Commission Network of Excellence - Top Amplifier Research Group (TARGET)pt
dc.description.sponsorshipFCT - Ph.D. Grant 11323/2002pt
dc.language.isoengpt
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)pt
dc.relation.uri<Go to ISI>://WOS:000224931100018-
dc.rightsrestrictedAccesspor
dc.subjectGaNpt
dc.subjectIntermodulation distortion (IMD)pt
dc.subjectModelingpt
dc.subjectPower amplifiers (PAs)pt
dc.subjectPower transistorspt
dc.titleNonlinear device model of microwave power GaNHEMTs for high power-amplifier designpt
dc.typearticlept
dc.peerreviewedyespt
ua.distributioninternationalpt
degois.publication.firstPage2585pt
degois.publication.issue11pt
degois.publication.lastPage2592pt
degois.publication.titleIEEE Transactions on Microwave Theory and Techniquespt
degois.publication.volume52pt
dc.date.embargo10000-01-01-
dc.identifier.doi10.1109/TMTT.2004.837196*
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