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|Title:||Defect concentration in nitrogen-doped graphene grown on Cu substrate: a thickness effect|
|Author:||Sharma, Dhananjay K.|
Hortigüela, María J.
Nogueira, Helena I. S.
Singh, Manoj Kumar
High Resolution-X-ray Photoelectron
|Abstract:||Tuning the band-gap of graphene is a current need for real device applications. Copper (Cu) as a substrate plays a crucial role in graphene deposition. Here we report the fabrication of in-situ nitrogen (N) doped graphene via chemical vapor deposition (CVD) technique and the effect of Cu substrate thickness on the growth mechanism. The ratio of intensities of G and D peaks was used to evaluate the defect concentration based on local activation model associated with the distortion of the crystal lattice due to incorporation of nitrogen atoms into graphene lattice. The results suggest that Cu substrate of 20μm in thickness exhibits higher defect density (1.86×1012 cm−2) as compared to both 10 and 25 μm thick substrates (1.23×1012 cm−2 and 3.09×1011 cm−2, respectively). Furthermore, High Resolution -X-ray Photoelectron Spectroscopy (HR-XPS) precisely affirms ~0.4 at% of nitrogen intercalations in graphene. Our results show that the substitutional type of nitrogen doping dominates over the pyridinic configuration. In addition, X-ray diffraction (XRD) shows all the XRD peaks associated with carbon. However, the peak at ~24° is suppressed by the substrate peaks (Cu). These results suggest that nitrogen atoms can be efficiently incorporated into the graphene using thinner copper substrates, rather than the standard 25 μm ones. This is important for tailoring the properties by graphene required for microelectronic applications.|
|Appears in Collections:||TEMA - Artigos|
CICECO - Artigos
DFis - Artigos
DQ - Artigos
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