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Please use this identifier to cite or link to this item: http://hdl.handle.net/10773/21052
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dc.contributor.authorKachkanov, Vyacheslavpt
dc.contributor.authorDolbnya, Igorpt
dc.contributor.authorO'Donnell, Kevinpt
dc.contributor.authorLorenz, Katharinapt
dc.contributor.authorPereira, Sergiopt
dc.contributor.authorWatson, Ianpt
dc.contributor.authorSadler, Thomaspt
dc.contributor.authorLi, Haoningpt
dc.contributor.authorZubialevich, Vitalypt
dc.contributor.authorParbrook, Peterpt
dc.date.accessioned2017-12-07T20:08:48Z-
dc.date.issued2013pt
dc.identifier.issn1862-6351pt
dc.identifier.urihttp://hdl.handle.net/10773/21052-
dc.description.abstractX-ray Reciprocal Space Mapping (RSM) is a powerful tool to explore the structure of semiconductor materials. However, conventional lab-based RSMs are usually measured in two dimensions (2D) ignoring the third dimension of diffraction-space volume. We report the use of a combination of X-ray microfocusing and state-of-the-art 2D area detectors to study the full volume of diffraction-space while probing III-nitride materials on the microscale. (C) 2012 WILEY-VCH Verlag GmbH \& Co. KGaA, Weinheimpt
dc.language.isoengpt
dc.publisherWILEY-V C H VERLAG GMBHpt
dc.relationinfo:eu-repo/grantAgreement/FCT/COMPETE/132936/PTpt
dc.rightsrestrictedAccesspor
dc.subjectALUMINUM NITRIDEpt
dc.subjectDIFFRACTIONpt
dc.subjectGANpt
dc.titleCharacterisation of III-nitride materials by synchrotron X-ray microdiffraction reciprocal space mappingpt
dc.typearticlept
dc.peerreviewedyespt
ua.distributioninternationalpt
degois.publication.firstPage481pt
degois.publication.issue3pt
degois.publication.lastPage485pt
degois.publication.titlePHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 10, NO 3pt
degois.publication.volume10pt
dc.date.embargo10000-01-01-
dc.relation.publisherversion10.1002/pssc.201200596pt
dc.identifier.doi10.1002/pssc.201200596pt
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