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http://hdl.handle.net/10773/21052
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DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kachkanov, Vyacheslav | pt |
dc.contributor.author | Dolbnya, Igor | pt |
dc.contributor.author | O'Donnell, Kevin | pt |
dc.contributor.author | Lorenz, Katharina | pt |
dc.contributor.author | Pereira, Sergio | pt |
dc.contributor.author | Watson, Ian | pt |
dc.contributor.author | Sadler, Thomas | pt |
dc.contributor.author | Li, Haoning | pt |
dc.contributor.author | Zubialevich, Vitaly | pt |
dc.contributor.author | Parbrook, Peter | pt |
dc.date.accessioned | 2017-12-07T20:08:48Z | - |
dc.date.issued | 2013 | pt |
dc.identifier.issn | 1862-6351 | pt |
dc.identifier.uri | http://hdl.handle.net/10773/21052 | - |
dc.description.abstract | X-ray Reciprocal Space Mapping (RSM) is a powerful tool to explore the structure of semiconductor materials. However, conventional lab-based RSMs are usually measured in two dimensions (2D) ignoring the third dimension of diffraction-space volume. We report the use of a combination of X-ray microfocusing and state-of-the-art 2D area detectors to study the full volume of diffraction-space while probing III-nitride materials on the microscale. (C) 2012 WILEY-VCH Verlag GmbH \& Co. KGaA, Weinheim | pt |
dc.language.iso | eng | pt |
dc.publisher | WILEY-V C H VERLAG GMBH | pt |
dc.relation | info:eu-repo/grantAgreement/FCT/COMPETE/132936/PT | pt |
dc.rights | restrictedAccess | por |
dc.subject | ALUMINUM NITRIDE | pt |
dc.subject | DIFFRACTION | pt |
dc.subject | GAN | pt |
dc.title | Characterisation of III-nitride materials by synchrotron X-ray microdiffraction reciprocal space mapping | pt |
dc.type | article | pt |
dc.peerreviewed | yes | pt |
ua.distribution | international | pt |
degois.publication.firstPage | 481 | pt |
degois.publication.issue | 3 | pt |
degois.publication.lastPage | 485 | pt |
degois.publication.title | PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 10, NO 3 | pt |
degois.publication.volume | 10 | pt |
dc.date.embargo | 10000-01-01 | - |
dc.relation.publisherversion | 10.1002/pssc.201200596 | pt |
dc.identifier.doi | 10.1002/pssc.201200596 | pt |
Appears in Collections: | CICECO - Artigos |
Files in This Item:
File | Description | Size | Format | |
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Characterisation of III-nitride materials by synchrotron X-ray microdiffraction reciprocal space mapping_10.1002pssc.201200596.pdf | 1.53 MB | Adobe PDF |
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