Please use this identifier to cite or link to this item:
http://hdl.handle.net/10773/20881
Title: | Quantification of surface displacements and electromechanical phenomena via dynamic atomic force microscopy |
Author: | Balke, Nina Jesse, Stephen Yu, Pu Carmichael, Ben Kalinin, Sergei V. Tselev, Alexander |
Keywords: | SCANNING PROBE MICROSCOPY FERROELECTRIC THIN-FILMS ACOUSTIC MICROSCOPY PIEZOELECTRIC COEFFICIENT CONTACT ELECTRIFICATION NANOMETER RESOLUTION YOUNGS MODULUS ELECTRIC-FIELD NANOSCALE SPECTROSCOPY |
Issue Date: | 2016 |
Publisher: | IOP PUBLISHING LTD |
Abstract: | Detection of dynamic surface displacements associated with local changes in material strain provides access to a number of phenomena and material properties. Contact resonance-enhanced methods of atomic force microscopy (AFM) have been shown capable of detecting similar to 1-3 pm-level surface displacements, an approach used in techniques such as piezoresponse force microscopy, atomic force acoustic microscopy, and ultrasonic force microscopy. Here, based on an analytical model of AFM cantilever vibrations, we demonstrate a guideline to quantify surface displacements with high accuracy by taking into account the cantilever shape at the first resonant contact mode, depending on the tip-sample contact stiffness. The approach has been experimentally verified and further developed for piezoresponse force microscopy (PFM) using well-defined ferroelectric materials. These results open up a way to accurate and precise measurements of surface displacement as well as piezoelectric constants at the pm-scale with nanometer spatial resolution and will allow avoiding erroneous data interpretations and measurement artifacts. This analysis is directly applicable to all cantilever-resonance-based scanning probe microscopy (SPM) techniques. |
Peer review: | yes |
URI: | http://hdl.handle.net/10773/20881 |
DOI: | 10.1088/0957-4484/27/42/425707 |
ISSN: | 0957-4484 |
Publisher Version: | 10.1088/0957-4484/27/42/425707 |
Appears in Collections: | CICECO - Artigos |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
Quantification of surface displacements and electromechanical phenomena via dynamic atomic force microscopy_10.10880957-44842742425707.pdf | 832.93 kB | Adobe PDF |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.