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|Title:||Band gaps of wurtzite ScxGa1-xN alloys|
|Author:||Tsui, H. C. L.|
Goff, L. E.
Rhode, S. K.
Beere, H. E.
Nicoll, C. A.
Ritchie, D. A.
Moram, M. A.
|Publisher:||AMER INST PHYSICS|
|Abstract:||Optical transmittance measurements on epitaxial, phase-pure, wurtzite-structure ScxGa1-xN films with 0 <= x <= 0.26 showed that their direct optical band gaps increased from 3.33 eV to 3.89 eV with increasing x, in agreement with theory. These films contained I-1- and I-2-type stacking faults. However, the direct optical band gaps decreased from 3.37 eV to 3.26 eV for ScxGa1-xN films, which additionally contained nanoscale lamellar inclusions of the zinc-blende phase, as revealed by aberration-corrected scanning transmission electron microscopy. Therefore, we conclude that the apparent reduction in ScxGa1-xN band gaps with increasing x is an artefact resulting from the presence of nanoscale zinc-blende inclusions. (C) 2015 AIP Publishing LLC.|
|Appears in Collections:||CICECO - Artigos|
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