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|Title:||Modification of magnetic anisotropy in Ni thin films by poling of (011) PMN-PT piezosubstrates|
|Publisher:||TAYLOR & FRANCIS LTD|
|Abstract:||This study reports the magnetic and magnetotransport properties of 20nm thick polycrystalline Ni films deposited by magnetron sputtering on unpoled piezoelectric (011) [PbMg1/3Nb2/3O3](0.68)-[PbTiO3](0.32) (PMN-PT) substrates. The magnetoresistance (MR), as well as the magnetization reversal, is found to depend on the polarization state of the piezosubstrate. Upon poling the PMN-PT substrate, which results in a transfer of strain to the Ni film, the MR value decreases by a factor of 12 at room temperature and a factor of 21 at 50K for the current direction along the PMN-PT  direction, and slightly increases for the current direction. Simultaneously, a strong increase in the room temperature coercive field value is observed, while the ratio between the remnant and saturation magnetization shows a pronounced minimum for the  direction, indicating it as a hard axis, induced by poling the piezosubstrate.|
|Appears in Collections:||CICECO - Artigos|
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|Modification of magnetic anisotropy in Ni thin films by poling of (011) PMN-PT piezosubstrates_10.108000150193.2016.1167519.pdf||692.74 kB||Adobe PDF|
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