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 Distribution of 1.68 eV emission from diamond films
Please use this identifier to cite or link to this item http://hdl.handle.net/10773/6485

title: Distribution of 1.68 eV emission from diamond films
authors: Correia, M.R.
Monteiro, T.
Pereira, E.
Costa, L.C.
keywords: Diamond
Elemental semiconductors
Semiconductor thin films
CVD coatings
Photoluminescence
Raman spectra
Spectral line intensity
Spectral line breadth
issue date: 1998
publisher: AIP
abstract: Free-standing polycrystalline chemical vapor deposition diamond films grown on a silicon wafer, with electrical behavior similar to values currently mentioned in the literature, present microheterogeneity. A detailed analysis by micro Raman shows how the diamond and nondiamond phases are distributed within the film and also the distribution of the silicon related luminescence. This luminescence is discussed in terms of two emitting centers close in energy. Absolute intensity of the diamond peak is not correlated with the good quality of the film as assessed by the Raman linewidth and ratio of this line to the nondiamond Raman lines
URI: http://hdl.handle.net/10773/6485
ISSN: 0021-8979
publisher version/DOI: dx.doi.org/10.1063/1.368284
source: Journal of Applied Physics
appears in collectionsFIS - Artigos

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