DSpace
 
  Repositório Institucional da Universidade de Aveiro > Departamento de Física > FIS - Artigos >
 Sintered NbO powders for electronic device applications
Please use this identifier to cite or link to this item http://hdl.handle.net/10773/6111

title: Sintered NbO powders for electronic device applications
authors: Nico, C.
Soares, M.R.N.
Rodrigues, J.
Matos, M.
Monteiro, R.
Graça, M.P.F.
Valente, M.A.
Costa, F.M.
Monteiro, T.
keywords: NbO
Nb2O5
XRD
SEM
Raman
PL
Dielectric measurements
issue date: 3-Mar-2011
publisher: ACS Publications
abstract: Wide band gap niobium oxides are particularly important for electronic device applications. Two types of NbO powders were sintered between 300 and 1100 °C. The structural characterization of the pellets, performed by X-ray diffraction measurements and Raman spectroscopy, revealed the appearance of the NbO and T-, B-, and H-Nb2O5 polymorphs, depending on the sintering temperature. The optical characterization was complemented with absorption measurements and photoluminescence, where it was possible to identify a bandgap of 3.5 eV. A strong dependence of luminescence on the sintering temperature and therefore of the niobium oxide crystalline phases nature was observed. The influence of the morphological and structural characteristics on the dielectrical properties, at room temperature and in the low frequency range (<100 MHz), was studied. The sample with the H-Nb2O5 polymorph presents higher dielectric constant (55) than the samples with T- and B-Nb2O5 (25).
URI: http://hdl.handle.net/10773/6111
ISSN: 1932-7447
publisher version/DOI: dx.doi.org/10.1021/jp110672u
source: Journal of Physical Chemistry C
appears in collectionsFIS - Artigos
I3N - Artigos

files in this item

file description sizeformat
JPhysChemC.pdfversão pdf do editor3.36 MBAdobe PDFview/open
Restrict Access. You can Request a copy!
statistics

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

 

Valid XHTML 1.0! RCAAP OpenAIRE DeGóis
ria-repositorio@ua.pt - Copyright ©   Universidade de Aveiro - RIA Statistics - Powered by MIT's DSpace software, Version 1.6.2