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 Optical and structural studies in Eu-implanted AlN films
Please use this identifier to cite or link to this item http://hdl.handle.net/10773/5631

title: Optical and structural studies in Eu-implanted AlN films
authors: Peres, Marco
Cruz, A.
Soares, Manuel
Neves, Armando
Monteiro, Teresa
Lorenz, K.
Alves, E.
keywords: AlN
RE’s
Ion implantation
RBS/C
PL
issue date: Dec-2006
publisher: Elsevier
abstract: Eu ions were incorporated into AlN thin films using ion implantation, and the influence of the post-implant annealing ambient on structural and optical properties was investigated. Eu is incorporated into lattice sites which are slightly displaced from the substitutional Al sites. When compared with the as-implanted sample the near-substitutional ion fraction is reduced due to the thermal annealing in different atmospheres. The AlN crystal quality does not change with different annealing conditions, but sensitive defect-related emission bands are developed under different annealing temperatures. Eu3+ optical activation is detected for all the annealed samples. No spectral changes are observed for the shape of the intra- transition, suggesting that a similar site symmetry is preserved even when a slight displacement from the substitutitional site of the Eu3+ ions occurs. The role of the annealing conditions on the spectral position and thermal quenching of the transition is discussed.
URI: http://hdl.handle.net/10773/5631
ISSN: 0749-6036
publisher version/DOI: http://dx.doi.org/10.1016/j.spmi.2006.07.031
source: Superlattices and Microstructures
appears in collectionsFIS - Artigos

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