Please use this identifier to cite or link to this item:
http://hdl.handle.net/10773/20337
Title: | Single- and Multi-Frequency Detection of Surface Displacements via Scanning Probe Microscopy |
Author: | Romanyuk, Konstantin Luchkin, Sergey Yu. Ivanov, Maxim Kalinin, Arseny Kholkin, Andrei L. |
Keywords: | ATOMIC-FORCE MICROSCOPY ELECTROCHEMICAL STRAIN MICROSCOPY THERMAL NOISE NANOSCALE SPECTROSCOPY CANTILEVERS DIFFUSION ANODES SOLIDS LIMIT |
Issue Date: | 2015 |
Publisher: | CAMBRIDGE UNIV PRESS |
Abstract: | Piezoresponse force microscopy (PFM) provides a novel opportunity to detect picometer-level displacements induced by an electric field applied through a conducting tip of an atomic force microscope (AFM). Recently, it was discovered that superb vertical sensitivity provided by PFM is high enough to monitor electric-field-induced ionic displacements in solids, the technique being referred to as electrochemical strain microscopy (ESM). ESM has been implemented only in multi-frequency detection modes such as dual AC resonance tracking (DART) and band excitation, where the response is recorded within a finite frequency range, typically around the first contact resonance. In this paper, we analyze and compare signal-to-noise ratios of the conventional single-frequency method with multi-frequency regimes of measuring surface displacements. Single-frequency detection ESM is demonstrated using a commercial AFM. |
Peer review: | yes |
URI: | http://hdl.handle.net/10773/20337 |
DOI: | 10.1017/S1431927614013622 |
ISSN: | 1431-9276 |
Publisher Version: | 10.1017/S1431927614013622 |
Appears in Collections: | CICECO - Artigos |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
Single- and Multi-Frequency Detection of Surface Displacements via Scanning Probe Microscopy_10.1017S1431927614013622.pdf | 1.28 MB | Adobe PDF |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.